Testing Methodology

We will only concentrate on testing the overclockability of the modules since there are no reliable memory benchmarks. Tests included running the modules at the rated timings of 2-3-2-5, as well as additional timings of 2.5-3-3-7 and 3-4-4-8.

For those who are not familiar with memory timings, the first number refers to the CAS Latency, the second number to the RAS-to-CAS Delay (tRCD), the third to the Row Precharge Delay (tRP), and the final number refers to the Row Active Delay (tRAS). For more information on these timings, please consult our BIOS Optimization Guide.

We also tested the memory modules at the rated voltage of 2.6V (measured voltage at 2.63V) as well as an increased voltage of 2.8V (measured voltage at 2.83V). To check stability at overclocked speeds, we tested the memory modules with Memtest86+ v1.50, running for about 4 hours in each test, which is approximately 5 passes in total, since they are 2GB modules.

For Mushkin HP3200 modules, the lowest rated voltage is 2.6V. That was our starting point. We then increased the voltage by 0.7V for the overvolted test, to see how it fairs at a higher voltage.

Test Results

CAS 2 Results

The modules are rated at 2-3-2, which is reasonably fast. That's pretty good since higher density modules usually do not fare as well as lower density ones.

We managed to run this pair of modules at 208MHz, or 416MHz DDR, at a modest increase of voltage at 2.8V. While the results are nothing astounding, it's considered pretty good for these mid-range modules. At 2.6V, the modules only faired slightly poorer at 206MHz (412MHz DDR).